今季ブランド HOUSE ARTECH USA Models Emission and Scattering Microwave : 洋書
ARTECH HOUSE USA : Microwave Scattering and Emission Models,ESSD - The global long-term microwave Vegetation Optical,Evolution characteristics of microwave absorbing carbon,Controllable and lightweight ZIF-67@PAN derived Co@C,AMT - Performance evaluation of portable dual-spot microMicrowave Scattering and Emission Models for Users (Artech House Remote Sensing)\r Adrian K. Fung, K. S. Chen\r430pp\rArtech House\r¥16,560